Hot-swap, lane configuration, fault injection, signal driving and power injection automation for PCIe Gen4 slots.
Product Information:
Fitting into a standard x16 PCIe slot, this PCIe module allows advanced, repeatable testing of PCIe devices. Controlled from the TestMonkey GUI or any standard scripting language, the module is simple to integrate into your test plan. With full control over every active PCIe pin, you can perform:
- Full hot-swap control of an attached PCIe card
- Individual control of all lanes, side-band, power and present pins
- Glitching of any signals
- Active driving of CLKREQ, PERST and WAKE signals
- Power margining and measurement via an additional Quarch power module
- Optional external triggering
- Optional inrush current limit
This module comes with a 40cm interface cable and requires a separately-purchased controller.
Allows a Power Module to inject power into a PCIe GEN4 Card.
Product Information:
This simple interposer fits in a x16 PCIe slot and allows power to be injected into the attached PCIe card.
Connected to one of our range of Programmable Power Modules, you can now perform power margining and measurement of the drive while using it within its normal operating environment.
The interposer synchronises with the host power to ensure your PCIe device is powered up at exactly the correct time.
Perform full hot-swap and fault injection with GEN4 PCIe SFF/U.2 drives.
Product Information:
Provides full hot-swap automation for GEN4 PCIe drives.
The module has full control over power, data (dual port) and present pins, allowing simulation of any possible hot-swap scenario. Individual control of each signal, pin bounce and high speed glitching combine to greatly increase the number of test cases you can perform. 'Driving' is available on some sideband pins, allowing a range of additional tests to drive signals high/low rather than just disconnecting them. The '+Triggering' version has additional MCX trigger IN/OUT to sync with external test equipment.
Drive modules can be used individually for simple bench testing, or multiple units can be used to automate an entire storage enclosure.
Each drive module requires one port on a Torridon Controller.
Perform full hot-swap and physical layer fault injection with GEN4 PCIe SFF/U.3 drives.
Product Information:
Provides full hot-swap automation for GEN4 PCIe drives using the latest U.3 (SFF-TA-1001) specification. This module works with any U.3-compatible device, regardless of the protocol used.
The module has full control over power, data (dual port) and present pins, allowing simulation of any possible hot-swap scenario. Individual control of each signal, pin bounce and high speed glitching combine to greatly increase the number of test cases you can perform. 'Driving' is available on some sideband pins, allowing a range of additional tests to drive signals high/low rather than just disconnecting them. The '+Triggering' version has additional MCX trigger IN/OUT to sync with external test equipment.
Drive modules can be used individually for simple bench testing, or multiple units can be used to automate an entire storage enclosure.
Each drive module requires one port on a Torridon Controller.
Convert a U.2 SFF drive to fit in a U.3 host for testing
Product Information:
This adaptor board allows standard U.2 drives to be used in a U.3 host, for test purposes.
The high speed signals are re-routed so the drive will work correctly on the host. Additional features include an optional flex cable to gain access to SMBUS for debug purposes.
